Process Analysis (MCT 222)

Term: 2025-2026 School Year Fall Term

Faculty

Aaron John LalleyShow MyInfo popup for Aaron John Lalley

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Mickelson Education Center 167/265

Schedule

Tue-Thu, 10:00 AM - 11:15 AM (8/25/2025 - 12/12/2025) Location: SF MICKE 159

Description

Provides students with the knowledge and understanding of a variety of measuring systems and methods through the text knowledge of the need for measurement, historical basis of measurement, and the various types of measurement methods used. The use of a variety of measurement equipment such as hand measurement tools, optical comparators, vision systems, and coordinate measurement machines (CMM) will also be covered.